Erik Jan Marinissen

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Sandeep Kumar GoelAcademician/Director, TSMCDirección de correo verificada de tsmc.com
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy EngineeringDirección de correo verificada de asu.edu
Said HamdiouiDelft University of TechnologyDirección de correo verificada de tudelft.nl
Mottaqiallah TaouilDelft University of TechnologyDirección de correo verificada de tudelft.nl
Mario KonijnenburgPrincipal Member of Technical StaffDirección de correo verificada de imec.nl
Dimitrios VelenisimecDirección de correo verificada de imec.be
Siddharth RaoResearcher, IMEC, BelgiumDirección de correo verificada de imec.be
Sergej DeutschIntel CorporationDirección de correo verificada de intel.com
Lizhou WuNational University of Defense Technology, ChinaDirección de correo verificada de nudt.edu.cn
Kees GoossensProfessor in Real-Time Embedded Systems, Eindhoven university of TechnologyDirección de correo verificada de tue.nl
Cheng-Wen Wu 吳誠文Department of Electrical Engineering, National Tsing Hua UniversityDirección de correo verificada de ee.nthu.edu.tw
Vivek ChickermaneDistinguished Engineer, Cadence Design SystemsDirección de correo verificada de cadence.com
Gouri Sankar KarVP R&D, IMEC BelgiumDirección de correo verificada de imec.be
Ferenc FodorimecDirección de correo verificada de imec.be
Sujit DeyProfessor of Electrical and Computer Engineering, University of California, San DiegoDirección de correo verificada de ucsd.edu
Harald VrankenOpen Universiteit & Radboud UniversiteitDirección de correo verificada de ou.nl
Hailong JIAOPeking UniversityDirección de correo verificada de pku.edu.cn
Hans-Joachim WunderlichProfessor Emeritus of Computer Science, University of StuttgartDirección de correo verificada de informatik.uni-stuttgart.de
Jos HuiskenAlways looking for new challenges ;-)Dirección de correo verificada de jostinako.com
Moritz FiebackTU DelftDirección de correo verificada de tudelft.nl

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Erik Jan Marinissen

Scientific Director at imec

Dirección de correo verificada de imec.be - Página principal

Test and debug of integrated circuits


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
Testing embedded-core based system chips Y Zorian, EJ Marinissen, S Dey Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998	817	1998
Test wrapper and test access mechanism co-optimization for system-on-chip V Iyengar, K Chakrabarty, EJ Marinissen Journal of Electronic Testing 18, 213-230, 2002	493	2002
A structured and scalable mechanism for test access to embedded reusable cores EJ Marinissen, R Arendsen, G Bos, H Dingemanse, M Lousberg, ... Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998	451	1998
A set of benchmarks for modular testing of SOCs EJ Marinissen, V Iyengar, K Chakrabarty Proceedings. International Test Conference, 519-528, 2002	406	2002
Testing 3D chips containing through-silicon vias EJ Marinissen, Y Zorian 2009 International Test Conference, 1-11, 2009	398	2009
Wrapper design for embedded core test EJ Marinissen, SK Goel, M Lousberg Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159 …, 2000	345	2000
Scan chain design for test time reduction in core-based ICs J Aerts, EJ Marinissen Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998	274	1998
On using rectangle packing for SOC wrapper/TAM co-optimization V Iyengar, K Chakrabarty, EJ Marinissen Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 253-258, 2002	233	2002
Effective and efficient test architecture design for SOCs SK Goel, EJ Marinissen Proceedings. International Test Conference, 529-538, 2002	232	2002
Towards a standard for embedded core test: An example EJ Marinissen, Y Zorian, R Kapur, T Taylor, L Whetsel International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999	216	1999
A structured and scalable test access architecture for TSV-based 3D stacked ICs EJ Marinissen, J Verbree, M Konijnenburg 2010 28th VLSI Test Symposium (VTS), 269-274, 2010	197	2010
On IEEE P1500’s standard for embedded core test EJ Marinissen, R Kapur, M Lousberg, T McLaurin, M Ricchetti, Y Zorian, ... SOC (System-on-a-Chip) Testing for Plug and Play Test Automation, 1-19, 2002	187	2002
Test access mechanism optimization, test scheduling, and tester data volume reduction for system-on-chip K Chakrabarty, EJ Marinissen IEEE Transactions on Computers 52 (12), 1619-1632, 2003	165	2003
Challenges in embedded memory design and test EJ Marinissen, B Prince, D Keltel-Schulz, Y Zorian Design, Automation and Test in Europe, 722-727, 2005	133	2005
Challenges and emerging solutions in testing TSV-based 2 1 over 2D-and 3D-stacked ICs EJ Marinissen 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2012	130	2012
SOC test architecture design for efficient utilization of test bandwidth SK Goel, EJ Marinissen ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4 …, 2003	128	2003
Application of deterministic logic BIST on industrial circuits G Kiefer, H Vranken, E Jan Marinissen, HJ Wunderlich Journal of Electronic Testing 17, 351-362, 2001	127	2001
Testing TSV-based three-dimensional stacked ICs EJ Marinissen 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010	125	2010
Impact of 3D design choices on manufacturing cost D Velenis, M Stucchi, EJ Marinissen, B Swinnen, E Beyne 2009 IEEE International Conference on 3D System Integration, 1-5, 2009	125	2009
Efficient wrapper/TAM co-optimization for large SOCs V Iyengar, K Chakrabarty, EJ Marinissen Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002	117	2002

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