Seguir
Arthur Beckers
Arthur Beckers
Dirección de correo verificada de esat.kuleuven.be - Página principal
Título
Citado por
Citado por
Año
Side-channel analysis of lattice-based post-quantum cryptography: Exploiting polynomial multiplication
C Mujdei, L Wouters, A Karmakar, A Beckers, JMB Mera, I Verbauwhede
ACM Transactions on Embedded Computing Systems, 2022
542022
Design and implementation of a waveform-matching based triggering system
A Beckers, J Balasch, B Gierlichs, I Verbauwhede
Constructive Side-Channel Analysis and Secure Design: 7th International …, 2016
302016
EM Information Security Threats Against RO-Based TRNGs: The Frequency Injection Attack Based on IEMI and EM Information Leakage
S Osuka, D Fujimoto, Y Hayashi, N Homma, A Beckers, J Balasch, ...
IEEE Transactions on Electromagnetic Compatibility 61 (4), 1122-1128, 2018
262018
An in-depth and black-box characterization of the effects of laser pulses on atmega328p
DSV Kumar, A Beckers, J Balasch, B Gierlichs, I Verbauwhede
Smart Card Research and Advanced Applications: 17th International Conference …, 2019
242019
Provable secure software masking in the real-world
A Beckers, L Wouters, B Gierlichs, B Preneel, I Verbauwhede
International Workshop on Constructive Side-Channel Analysis and Secure …, 2022
172022
Design considerations for em pulse fault injection
A Beckers, M Kinugawa, Y Hayashi, D Fujimoto, J Balasch, B Gierlichs, ...
Smart Card Research and Advanced Applications: 18th International Conference …, 2020
172020
Semi-automatic locating of cryptographic operations in side-channel traces
J Trautmann, A Beckers, L Wouters, S Wildermann, I Verbauwhede, ...
IACR Transactions on Cryptographic Hardware and Embedded Systems, 345-366, 2022
162022
Characterization of em faults on atmega328p
A Beckers, J Balasch, B Gierlichs, I Verbauwhede, S Osuka, M Kinugawa, ...
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo …, 2019
162019
Detection of IEMI fault injection using voltage monitor constructed with fully digital circuit
D Fujimoto, Y Hayashi, A Beckers, J Balasch, B Gierlichs, I Verbauwhede
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
162018
Fault analysis of the chacha and salsa families of stream ciphers
A Beckers, B Gierlichs, I Verbauwhede
Smart Card Research and Advanced Applications: 16th International Conference …, 2018
92018
Teaching HW/SW codesign with a Zynq ARM/FPGA SoC
J Balasch, A Beckers, D Božilov, SS Roy, F Turan, I Verbauwhede
2018 12th European Workshop on Microelectronics Education (EWME), 63-66, 2018
62018
Comparison of two setups for contactless power measurements for side-channel analysis
A Beckers, B Gierlichs, J Balasch, I Verbauwhede
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
52018
Design and evaluation of a spark gap based EM-fault injection setup
A Beckers, M Kinugawa, Y Hayashi, J Balasch, I Verbauwhede
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
42020
Fundamental study on non-invasive frequency injection attack against RO-based TRNG
S Osuka, D Fujimoto, Y Hayashi, N Homma, A Beckers, J Balasch, ...
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018
42018
(Adversarial) Electromagnetic Disturbance in the Industry
A Beckers, S Guilley, P Maurine, C O'Flynn, S Picek
IEEE Transactions on Computers 72 (2), 414-422, 2022
22022
Practical Fault Attacks on Cryptographic Devices
A Beckers, I Verbauwhede, W Gierlichs
22021
Fault Attack Investigation on TaO Resistive-RAM for Cyber Secure Application
A Kumar, R Degraeve, A Beckers, A Fantini, I Verbauwhede, D Linten, ...
IEEE Transactions on Electron Devices, 2023
12023
Energy and side-channel security evaluation of near-threshold cryptographic circuits in 28nm FD-SOI technology
A Beckers, R Uytterhoeven, T Vandenabeele, J Vliegen, L Wouters, ...
Proceedings of the 19th ACM International Conference on Computing Frontiers …, 2022
12022
A Study on Output Bit Tampering of True Random Number Generators Using Time-Varying EM Waves
S Osuka, D Fujimoto, A Beckers, B Gierlichs, I Verbauwhede, Y Hayashi
2021 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2021
12021
{SpectrEM}: Exploiting Electromagnetic Emanations During Transient Execution
J De Meulemeester, A Purnal, L Wouters, A Beckers, I Verbauwhede
32nd USENIX Security Symposium (USENIX Security 23), 6293-6310, 2023
2023
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20