Piet Bijl

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Alexander Toetretired from TNODirección de correo verificada de tno.nl
HogervorstTNODirección de correo verificada de tno.nl
FL KooiTNODirección de correo verificada de tno.nl
Judith DijkSenior research scientist, TNO, the NetherlandsDirección de correo verificada de tno.nl
Jan J. KoenderinkProfessor of physics, Delft University of Technology and Katholieke Universiteit LeuvenDirección de correo verificada de telfort.nl
Klamer SchutteTNO, Intelligent ImagingDirección de correo verificada de TNO.nl
Marcel LucassenSignifyDirección de correo verificada de lucr.nl
Stefan KeßlerFraunhofer Institute of Optronics, System Technologies and Image Exploitation IOSBDirección de correo verificada de iosb.fraunhofer.de
Adam van EekerenResearch Scientist, TNO, The NetherlandsDirección de correo verificada de tno.nl
Astrid M.L. KappersTU/e EindhovenDirección de correo verificada de tue.nl
Richard H. VollmerhausenPhD Electrical and Computer engineeringDirección de correo verificada de hughes.net
Leslie N. SmithNaval Research LaboratoryDirección de correo verificada de nrl.navy.mil
Bas van den BroekTNODirección de correo verificada de tno.nl
Richard den HollanderResearch scientist at TNODirección de correo verificada de tno.nl
Henri BoumaSenior scientist at TNODirección de correo verificada de tno.nl
David L WilsonRobert Herbold Professor of Biomedical Engineering and Radiology, Case Western Reserve UniversityDirección de correo verificada de case.edu
Richard K. Mooreprincipal engineer at Mclaurin AerospaceDirección de correo verificada de mclaurin.aero
J.W.A.M. (Johan) AlferdinckTNODirección de correo verificada de tno.nl

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Piet Bijl

PhD in Physics, Utrecht University

Dirección de correo verificada de tno.nl

electro-optical systems performance characterization vision psychophysics


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
Triangle orientation discrimination: the alternative to minimum resolvable temperature difference and minimum resolvable contrast P Bijl, JM Valeton Optical Engineering 37 (7), 1976-1983, 1998	144	1998
Guidelines for accurate TOD measurement P Bijl, JM Valeton Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X 3701, 14-25, 1999	82	1999
TOD: a new method to characterize electro-optical system performance P Bijl, JM Valeton Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX 3377 …, 1998	78	1998
Image dataset for testing search and detection models A Toet, P Bijl, JM Valeton Optical Engineering 40 (9), 1760-1767, 2001	75	2001
Visual conspicuity determines human target acquisition performance A Toet, FL Kooi, P Bijl, JM Valeton Optical Engineering 37 (7), 1969-1975, 1998	75	1998
Validation of the new triangle orientation discrimination method and ACQUIRE model predictions using observer performance date for ship targets P Bijl, JM Valeton Optical Engineering 37 (7), 1984-1994, 1998	62	1998
Capturing the sampling effects: a TOD sensor performance model MA Hogervorst, P Bijl, JM Valeton Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII 4372 …, 2001	61	2001
Automated detection and monitoring of methane super-emitters using satellite data BJ Schuit, JD Maasakkers, P Bijl, G Mahapatra, AW Van den Berg, ... Atmospheric Chemistry and Physics Discussions 2023, 1-47, 2023	60	2023
TOD predicts target acquisition performance for staring and scanning thermal imagers P Bijl, JM Valeton, AN de Jong Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI 4030 …, 2000	59	2000
A high-resolution image data set for testing search and detection models A Toet, P Bijl, FL Kooi, JM Valeton TNO-report TM-98-A020, 1998	54	1998
TOD, NVTherm, and TRM3 model calculations: a comparison P Bijl, MA Hogervorst, JM Valeton Infrared and Passive Millimeter-Wave Imaging Systems: Design, Analysis …, 2002	40	2002
Visibility of blobs with a Gaussian luminance profile P Bijl, JJ Koenderink, A Toet Vision research 29 (4), 447-456, 1989	38	1989
Applicability of TOD, MTDP, MRT and DMRT for dynamic image enhancement techniques P Bijl, K Schutte, MA Hogervorst Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII 6207 …, 2006	35	2006
Automatic characterization of electro-optical sensors with image processing using the triangle orientation discrimination (TOD) method DJ de Lange, JM Valeton, P Bijl Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI 4030 …, 2000	27	2000
Modular target acquisition model and visualization tool P Bijl, MA Hogervorst, WK Vos Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX 6941 …, 2008	24	2008
NVThermIP vs TOD: matching the Target Acquisition range criteria P Bijl, MA Hogervorst Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII 6543 …, 2007	23	2007
Bias-free procedure for the measurement of the minimum resolvable temperature difference and minimum resolvable contrast P Bijl, JM Valeton Optical Engineering 38 (10), 1735-1742, 1999	22	1999
Quantifying target distinctness through visual conspicuity A Toet, P Bijl, FL Kooi, JM Valeton Targets and Backgrounds: Characterization and Representation IV 3375, 152-163, 1998	21	1998
TOD to TTP calibration P Bijl, JP Reynolds, WK Vos, MA Hogervorst, JD Fanning Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII 8014 …, 2011	20	2011
Aspects of Visual Contrast Detection P Bijl Utrecht University, 1991	20	1991

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