| Multilevel-cell phase-change memory: A viable technology A Athmanathan, M Stanisavljevic, N Papandreou, H Pozidis, E Eleftheriou IEEE Journal on Emerging and Selected Topics in Circuits and Systems 6 (1 …, 2016 | 162 | 2016 |
| HERMES Core–A 14nm CMOS and PCM-based In-Memory Compute Core using an array of 300ps/LSB Linearized CCO-based ADCs and local digital processing R Khaddam-Aljameh, M Stanisavljevic, JF Mas, G Karunaratne, ... 2021 Symposium on VLSI Circuits, 1-2, 2021 | 104 | 2021 |
| A high-performance system for robust stain normalization of whole-slide images in histopathology A Anghel, M Stanisavljevic, S Andani, N Papandreou, JH Rüschoff, P Wild, ... Frontiers in medicine 6, 193, 2019 | 94 | 2019 |
| A 64-core mixed-signal in-memory compute chip based on phase-change memory for deep neural network inference M Le Gallo, R Khaddam-Aljameh, M Stanisavljevic, A Vasilopoulos, ... Nature Electronics 6 (9), 680-693, 2023 | 80 | 2023 |
| HERMES-Core—A 1.59-TOPS/mm2 PCM on 14-nm CMOS In-Memory Compute Core Using 300-ps/LSB Linearized CCO-Based ADCs R Khaddam-Aljameh, M Stanisavljevic, JF Mas, G Karunaratne, M Brändli, ... IEEE Journal of Solid-State Circuits 57 (4), 1027-1038, 2022 | 74 | 2022 |
| Reliability of nanoscale circuits and systems: methodologies and circuit architectures M Stanisavljević, A Schmid, Y Leblebici Springer Science & Business Media, 2010 | 73 | 2010 |
| Demonstration of reliable triple-level-cell (TLC) phase-change memory M Stanisavljevic, H Pozidis, A Athmanathan, N Papandreou, ... 2016 IEEE 8th international memory workshop (IMW), 1-4, 2016 | 57 | 2016 |
| Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures M Stanisavljevic, A Athmanathan, N Papandreou, H Pozidis, E Eleftheriou 2015 IEEE International Reliability Physics Symposium, 5B. 6.1-5B. 6.6, 2015 | 43 | 2015 |
| Deep learning acceleration based on in-memory computing E Eleftheriou, M Le Gallo, SR Nandakumar, C Piveteau, I Boybat, V Joshi, ... IBM Journal of Research and Development 63 (6), 7: 1-7: 16, 2019 | 31 | 2019 |
| Optimization of the averaging reliability technique using low redundancy factors for nanoscale technologies M Stanisavljevic, A Schmid, Y Leblebici IEEE Transactions on Nanotechnology 8 (3), 379-390, 2008 | 26 | 2008 |
| Toward software-equivalent accuracy on transformer-based deep neural networks with analog memory devices K Spoon, H Tsai, A Chen, MJ Rasch, S Ambrogio, C Mackin, A Fasoli, ... Frontiers in Computational Neuroscience 15, 675741, 2021 | 23 | 2021 |
| Fault-tolerance of robust feed-forward architecture using single-ended and differential deep-submicron circuits under massive defect density M Stanisavljevic, A Schmid, Y Leblebici The 2006 IEEE International Joint Conference on Neural Network Proceedings …, 2006 | 22 | 2006 |
| A heterogeneous and programmable compute-in-memory accelerator architecture for analog-ai using dense 2-d mesh S Jain, H Tsai, CT Chen, R Muralidhar, I Boybat, MM Frank, S Woźniak, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 31 (1), 114-127, 2022 | 21 | 2022 |
| Optimization of nanoelectronic systems’ reliability under massive defect density using cascaded R-fold modular redundancy M Stanisavljevic, A Schmid, Y Leblebici Nanotechnology 19 (46), 465202, 2008 | 21 | 2008 |
| Phase change memory reliability: A signal processing and coding perspective H Pozidis, T Mittelholzer, N Papandreou, T Parnell, M Stanisavljevic IEEE Transactions on Magnetics 51 (4), 1-7, 2015 | 17 | 2015 |
| A 6-bit drift-resilient readout scheme for multi-level phase-change memory A Athmanathan, M Stanisavljevic, J Cheon, S Kang, C Ahn, J Yoon, ... 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC), 137-140, 2014 | 16 | 2014 |
| The complete time/temperature dependence of IV drift in PCM devices M Le Gallo, A Sebastian, D Krebs, M Stanisavljevic, E Eleftheriou 2016 IEEE International Reliability Physics Symposium (IRPS), MY-1-1-MY-1-6, 2016 | 15 | 2016 |
| Open block characterization and read voltage calibration of 3D QLC NAND flash N Papandreou, H Pozidis, N Ioannou, T Parnell, R Pletka, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 14 | 2020 |
| Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect N Papandreou, N Ioannou, T Parnell, R Pletka, M Stanisavljevic, R Stoica, ... 2019 19th Non-Volatile Memory Technology Symposium (NVMTS), 1-4, 2019 | 13 | 2019 |
| Optimization of nanoelectronic systems reliability under massive defect density using distributed R-fold modular redundancy (DRMR) M Stanisavljevic, A Schmid, Y Leblebici 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009 | 13 | 2009 |
