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Alistair Duffy
Alistair Duffy
Dirección de correo verificada de dmu.ac.uk
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Feature selective validation (FSV) for validation of computational electromagnetics (CEM). part I-the FSV method
AP Duffy, AJM Martin, A Orlandi, G Antonini, TM Benson, MS Woolfson
IEEE transactions on electromagnetic compatibility 48 (3), 449-459, 2006
4762006
Feature selective validation (FSV) for validation of computational electromagnetics (CEM). part II-assessment of FSV performance
A Orlandi, AP Duffy, B Archambeault, G Antonini, DE Coleby, S Connor
IEEE transactions on electromagnetic compatibility 48 (3), 460-467, 2006
3772006
Dielectric relaxation spectroscopy and some applications in the pharmaceutical sciences
G Smith, AP Duffy, J Shen, CJ Olliff
Journal of pharmaceutical sciences 84 (9), 1029-1044, 1995
1381995
Applying a behavioural and operational diagnostic typology of competitive intelligence practice: empirical evidence from the SME sector in Turkey
S Wright, C Bisson, AP Duffy
Competitive Intelligence, Analysis and Strategy, 68-82, 2014
702014
Validation of a three-dimensional transmission line matrix (TLM) model implementation of a mode-stirred reverberation chamber
A Coates, HG Sasse, DE Coleby, AP Duffy, A Orlandi
IEEE Transactions on Electromagnetic Compatibility 49 (4), 734-744, 2007
552007
The feature selective validation (FSV) method
A Duffy, A Martin, G Antonini, A Orlandi, C Ritota
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC …, 2005
502005
Review of the feature selective validation method (FSV). Part I—Theory
AP Duffy, A Orlandi, G Zhang
IEEE Transactions on Electromagnetic Compatibility 60 (4), 814-821, 2018
492018
A simple formula for calculating the frequency‐dependent resistance of a round wire
MM Al‐Asadi, AP Duffy, AJ Willis, K Hodge, TM Benson
Microwave and Optical Technology Letters 19 (2), 84-87, 1998
451998
Competitive intelligence and information technology adoption of SMEs in Turkey: Diagnosing current performance and identifying barriers
S Wright, C Bisson, A Duffy
Journal of Intelligence Studies in Business 3 (2), 2013
422013
Surface transfer impedance measurement: A comparison between current probe and pull-on braid methods for coaxial cables
A Morriello, TM Benson, AP Duffy, CF Cheng
IEEE transactions on electromagnetic compatibility 40 (1), 69-76, 1998
401998
Performance comparison of the SGM and the SCM in EMC simulation
J Bai, G Zhang, D Wang, AP Duffy, L Wang
IEEE Transactions on Electromagnetic Compatibility 58 (6), 1739-1746, 2016
362016
Analysis of techniques to compare complex data sets
DE Coleby, AP Duffy
COMPEL-The international journal for computation and mathematics in …, 2002
362002
A taxonomy of technical attribution techniques for cyber attacks
A Nicholson, T Watson, P Norris, A Duffy, R Isbell
European conference on information warfare and security, 188, 2012
342012
Enhancing feature selective validation (FSV) interpretation of EMC/SI results with grade-spread
A Orlandi, G Antonini, C Ritota, AP Duffy
2006 IEEE International Symposium on Electromagnetic Compatibility, 2006 …, 2006
342006
Analyzing transient phenomena in the time domain using the feature selective validation (FSV) method
R Jauregui, G Zhang, J Rojas-Mora, O Ventosa, F Silva, AP Duffy, ...
IEEE transactions on electromagnetic compatibility 56 (4), 825-834, 2013
322013
Over coupled ring resonator-based add/drop filters
RD Mansoor, H Sasse, M Al Asadi, SJ Ison, AP Duffy
IEEE journal of quantum electronics 50 (8), 598-604, 2014
312014
Review of the feature selective validation method (FSV). Part II-Performance analysis and research fronts
A Orlandi, AP Duffy, G Zhang
IEEE, 2018
302018
Improved wire modelling in TLM
AP Duffy, JL Herring, TM Benson, C Christopoulos
IEEE transactions on microwave theory and techniques 42 (10), 1978-1983, 1994
281994
Development of a new high current, Hybrid ‘Ferrite-Rogowski’, high frequency current transformer for partial discharge sensing in medium and high voltage cabling
MJ Foxall, AP Duffy, J Gow, M Seltzer-Grant, L Renforth
59th International Wire & Cable Symposium, 1-5, 2010
272010
Factors influencing the successful validation of transient phenomenon modelling
RJ Telleria, F Silva, A Orlandi, H Sasse, A Duffy
2010 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2010
262010
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Artículos 1–20