Research Scientist at Software Engineering Application Technology Lab, Huawei Technologies Co., Ltd
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TBar: Revisiting template-based automated program repair
K Liu, A Koyuncu, D Kim, TF Bissyandé
Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019
Automated testing of android apps: A systematic literature review
P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein
IEEE Transactions on Reliability 68 (1), 45-66, 2018
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
Empirical Software Engineering 25, 1980-2024, 2020
Avatar: Fixing semantic bugs with fix patterns of static analysis violations
K Liu, A Koyuncu, D Kim, TF Bissyandé
2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019
You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems
K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon
2019 12th IEEE conference on software testing, validation and verification …, 2019
Mining fix patterns for findbugs violations
K Liu, D Kim, TF Bissyandé, S Yoo, Y Le Traon
IEEE Transactions on Software Engineering 47 (1), 165-188, 2018
On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs
K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ...
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
Learning to spot and refactor inconsistent method names
K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon
2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019
Evaluating representation learning of code changes for predicting patch correctness in program repair
H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé
Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020
iFixR: Bug report driven program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon
Proceedings of the 2019 27th ACM joint meeting on european software …, 2019
A critical review on the evaluation of automated program repair systems
K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé
Journal of Systems and Software 171, 110817, 2021
LSRepair: Live search of fix ingredients for automated program repair
K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé
2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018
A closer look at real-world patches
K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon
2018 IEEE International Conference on Software Maintenance and Evolution …, 2018
Exploring how deprecated python library apis are (not) handled
J Wang, L Li, K Liu, H Cai
Proceedings of the 28th acm joint meeting on european software engineering …, 2020
The best of both worlds: integrating semantic features with expert features for defect prediction and localization
C Ni, W Wang, K Yang, X Xia, K Liu, D Lo
Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022
D&c: A divide-and-conquer approach to ir-based bug localization
A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon
arXiv preprint arXiv:1902.02703, 2019
Automated comment update: How far are we?
B Lin, S Wang, K Liu, X Mao, TF Bissyandé
2021 IEEE/ACM 29th International Conference on Program Comprehension (ICPC …, 2021
Predicting patch correctness based on the similarity of failing test cases
H Tian, Y Li, W Pian, AK Kabore, K Liu, A Habib, J Klein, TF Bissyandé
ACM Transactions on Software Engineering and Methodology (TOSEM) 31 (4), 1-30, 2022
Towards automatically repairing compatibility issues in published Android apps
Y Zhao, L Li, K Liu, J Grundy
Proceedings of the 44th International Conference on Software Engineering …, 2022
Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems
D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ...
Empirical Software Engineering 26, 1-33, 2021
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